Label
X-rays + Diffraction
Incoming Resources
- X-ray topography, David R. Black, Gabrielle G. Long
- Status of structural analysis of substrates and film growth inputs for GaN device development program, Kevin Kirchner
- JMFA--a graphically interactive java program that fits microfibril angle x-ray diffraction data, Steve P. Verrill, David E. Kretschmann, Victoria L. Herian
- Characterization of corrosion on outdoor-exposed aluminum metal-matrix composites as a function of reinforcement specie and volume fraction, Ralph P.I. Adler [and others]
- JMFA 2--a graphically interactive Java program that fits microfibril angle x-ray diffraction data, Steve P. Verrill, David E. Kretschmann, Victoria L. Herian