The Resource Thermal characterization of thin films for MEMS applications, by David J. Howe and Brian Morgan, (electronic resource)
Thermal characterization of thin films for MEMS applications, by David J. Howe and Brian Morgan, (electronic resource)
Resource Information
The item Thermal characterization of thin films for MEMS applications, by David J. Howe and Brian Morgan, (electronic resource) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Public Libraries of Suffolk County, New York.This item is available to borrow from 1 library branch.
Resource Information
The item Thermal characterization of thin films for MEMS applications, by David J. Howe and Brian Morgan, (electronic resource) represents a specific, individual, material embodiment of a distinct intellectual or artistic creation found in Public Libraries of Suffolk County, New York.
This item is available to borrow from 1 library branch.
- Extent
- iv, 14 pages
- Note
-
- Title from title screen (viewed on May 26, 2009)
- "February 2008."
- Label
- Thermal characterization of thin films for MEMS applications
- Title
- Thermal characterization of thin films for MEMS applications
- Statement of responsibility
- by David J. Howe and Brian Morgan
- Title variation
- Thermal characterization of thin films for microelectromechanical systems applications
- Language
- eng
- http://library.link/vocab/creatorName
- Howe, David J
- Government publication
- federal national government publication
- Index
- no index present
- Literary form
- non fiction
- Nature of contents
- dictionaries
- http://library.link/vocab/relatedWorkOrContributorName
-
- Morgan, Brian
- U.S. Army Research Laboratory
- Series statement
- ARL-TR
- Series volume
- 4378
- http://library.link/vocab/subjectName
- Microelectromechanical systems
- Label
- Thermal characterization of thin films for MEMS applications, by David J. Howe and Brian Morgan, (electronic resource)
- Note
-
- Title from title screen (viewed on May 26, 2009)
- "February 2008."
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Extent
- iv, 14 pages
- Form of item
- electronic
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- bc
- Other physical details
- digital, PDF file.
- System details
- Mode of access: Internet from the ARL web site. Address as of 5/26/09: http://www.arl.army.mil/arlreports/2008/ARL-TR-4378.pdf ; current access is available via PURL
- Label
- Thermal characterization of thin films for MEMS applications, by David J. Howe and Brian Morgan, (electronic resource)
- Note
-
- Title from title screen (viewed on May 26, 2009)
- "February 2008."
- Carrier category
- online resource
- Carrier category code
-
- cr
- Carrier MARC source
- rdacarrier
- Content category
- text
- Content type code
-
- txt
- Content type MARC source
- rdacontent
- Extent
- iv, 14 pages
- Form of item
- electronic
- Media category
- computer
- Media MARC source
- rdamedia
- Media type code
-
- bc
- Other physical details
- digital, PDF file.
- System details
- Mode of access: Internet from the ARL web site. Address as of 5/26/09: http://www.arl.army.mil/arlreports/2008/ARL-TR-4378.pdf ; current access is available via PURL
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.livebrary.com/portal/Thermal-characterization-of-thin-films-for-MEMS/1_MlusJm7Hg/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.livebrary.com/portal/Thermal-characterization-of-thin-films-for-MEMS/1_MlusJm7Hg/">Thermal characterization of thin films for MEMS applications, by David J. Howe and Brian Morgan, (electronic resource)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.livebrary.com/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="https://link.livebrary.com/">Public Libraries of Suffolk County, New York</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.livebrary.com/portal/Thermal-characterization-of-thin-films-for-MEMS/1_MlusJm7Hg/" typeof="Book http://bibfra.me/vocab/lite/Item"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.livebrary.com/portal/Thermal-characterization-of-thin-films-for-MEMS/1_MlusJm7Hg/">Thermal characterization of thin films for MEMS applications, by David J. Howe and Brian Morgan, (electronic resource)</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.livebrary.com/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="https://link.livebrary.com/">Public Libraries of Suffolk County, New York</a></span></span></span></span></div>
