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Method and apparatus for the quantification of particulate adhesion forces on various substrates, Christopher J. Wohl, Brad M. Atkins, John W. Connell

Label
Method and apparatus for the quantification of particulate adhesion forces on various substrates, Christopher J. Wohl, Brad M. Atkins, John W. Connell
Language
eng
Bibliography note
Includes bibliographical references (pages 14-16)
resource.governmentPublication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary Form
non fiction
Main title
Method and apparatus for the quantification of particulate adhesion forces on various substrates
Medium
electronic resource
Nature of contents
bibliographydictionariestechnical reports
Responsibility statement
Christopher J. Wohl, Brad M. Atkins, John W. Connell
Series statement
NASA-TM, 2011-217048
Content

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